ALEXANDRIA, Va., July 23 -- United States Patent no. 12,365,780, issued on July 22, was assigned to Inter IKEA Systems B.V. (Delft, Netherlands). "Polyester textile waste recycling" was invented by Z... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. D1,084,624, issued on July 22, was assigned to Caleres Inc. (St. Louis). "Shoe sole" was invented by Jean Bonkowski (St. Louis), Amanda Butler (St... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,800, issued on July 22, was assigned to SONY GROUP Corp. (Tokyo) and SONY PICTURES ENTERTAINMENT INC. (Culver City, Calif.). "Active off-ax... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,481, issued on July 22, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Reflector plate for substrate processing" was invent... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,369,454, issued on July 22, was assigned to DUK SAN NEOLUX Co. LTD. (Cheonan-si, South Korea). "Method for preparing pixel define layer" was in... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,368,371, issued on July 22, was assigned to SOUTHEAST UNIVERSITY (Nanjing, China). "Non-isolated resonant gate drive circuit" was invented by Q... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,364,363, issued on July 22, was assigned to North Atlantic Imports LLC (Logan, Utah). "Griddle cooking station and method thereof" was invented... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,047, issued on July 22, was assigned to SiFive Inc. (Santa Clara, Calif.). "Debug trace circuitry configured to generate a record including... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,367,829, issued on July 22, was assigned to SAMSUNG DISPLAY Co. LTD. (Yongin-si, South Korea). "Pixel capable of compensating for threshold vol... Read More
ALEXANDRIA, Va., July 23 -- United States Patent no. 12,368,015, issued on July 22, was assigned to Ze Chen (Yueqing, China). "Self-test mechanisms for end-of-life detection and response for circuit ... Read More